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The recent release of the newest x-ray fluorescence analyzer focusing on coating thickness measurements, the Hitachi FT230, is the result of years of work by the R&D team of Hitachi High-Tech. Work began by talking with users of XRF technology to see what operators like, and don’t like, in their current analyzers. However, this meant not just talking with users of current Hitachi systems (and older models from them, known as Seiko and Oxford Instruments) but also users of other brands (Fischerscope, Bowman XRF, etc).
Hitachi determined a lot from these discussions, but one overwhelming point stood out…XRF users want to limit the amount of time they spend setting up for a measurement run. It is estimated that 72% of XRF testing time is lost on set-up – the old adage that ‘time is money’ might pop into your mind right about now
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