Innovative New Hitachi XRF:
FT230 for Coating Measurements

The next advancement in X-Ray Fluorescence (XRF) was developed to not only provide highly precise results but also to limit operators time in sample set up through an innovative software package.
This means you see:
     - greater lab efficiencies
​     - increased time for actual measurements
​     - along with that high precision
Every single element of the Hitachi FT230 has been designed to
drastically reduce set-up/analysis time and increase throughput for your quality control processes
HITACHI FT230 HIGHLIGHTS
  • Automated focusing reduces sample loading time
  • Find My Part™ smart recognition automatically sets the complete measurement routine
  • Sample view is presented over a large part of the screen for excellent visibility
  • Self-checking diagnostics confirms the health and stability of the instrument
  • Integrates seamlessly with other software and easily exports data
  • Intuitive and easy to use by non-specialists thanks to a new user interface
  • Powerful to measure up to four layers at once plus the substrate
  • Durable for a long-life in a challenging production or lab environment
  • Conforms to ASTM B568 test method and DIN ISO 3497
  • Helps you meet specifications for:
    ENIG (IPC-4552B) and ENEPIG (IPC-4556)
    immersion Sn (IPC-4554) and immersion Ag (IPC-4553A)