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  • Analyzer Sales
    • Coating Thickness >
      • Hitachi FT110A
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      • Contact Gauges
    • Elemental Analyzers >
      • Hitachi EA6000VX
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      • Phthalates Tester
      • Bulk Analyzers
    • Handheld XRF Analyzers >
      • Alloy Tester
      • Xmet Video Demos
      • Sample XRF Report
      • XRF Rental Info
    • Used XRF Analyzers >
      • Available Used XRF
    • Other Technologies >
      • Handheld LIBS
      • Spectrophotometers: UV, NIR, FL
    • Mexico XRF Sales
  • Applications
    • Coating Thickness >
      • Common Coating Thickness
      • Ultra Thin Thickness
    • RoHS Testing
    • Analytical Labs
    • Alloy Analysis >
      • PMI: Alloy Testing
    • App Downloads
  • Service & Standards
    • Standards Laboratory >
      • New XRF Standards
      • XRF Standards Certification
      • Private Label Services
    • Instrument Services >
      • XRF Certification
      • Evaluation / Repair
      • Handheld XRF Services
      • Handheld XRF Spares
      • Xray Radiation Safety Inspection
      • Protection Plans
    • Accreditations
  • Technology
    • Tech Blog
    • What is XRF?
    • XRF Benefits
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    • Contact
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New X-Strata920 by Hitachi High-Tech:
​
XRF with Silicon Drift Detector Option

The X-Strata920 coating thickness measurement system is known as one of the most reliable systems offered by Hitachi High-Tech. Previously available under the Oxford Instruments name, the newest X-Strata920 has expanded the analyzers application reach by adding a Silicon Drift Detector (SDD) option. 

​The SDD configuration, which is competitively priced, allows a user to measure the broadest range of coating applications - from basic single layer applications to complex stacks (specifically, it meets IPC4552A standard for ENIG as well as ENEPIG and others).
Hitachi XRF with Silicon Drift Detector
Hitachi XRF with optional Silicon Drift Detector (SDD) technology.
Request Application Info
Download Analyzer Brochure
MAJOR ADVANCEMENTS AND FEATURES

Silicon Drift Detector (SDD): critical for many applications, the high resolution SDD Technology makes the X-Strata920 a powerful analyzer while remaining competitively priced

Chamber Configuration / Sizes: Multiple configurations are available depending on a users needs; slotted chambers, motorized stage, tall chambers, etc. Review the 3 XRF Chamber Configurations.

Small Collimators: Another option that is customized for the users needs is in the collimator package; the smallest is 0.025 x 0.05 mm

Flexibility in Calibration: The Hitachi X-Strata920 allows users to add as many calibrations as they need...without assistance from service (means no additional costs like other brands)!

Built for Printed Circuit Boards: Combine the SDD model for measurements of ENIG/ENEPIG, thin gold, etc with the motorized XY (movement of 7"x7") for easy quality control of circuit boards

​LEARN MORE:
  • Measuring ENIG/ENEPIG coatings with xray fluorescence; for IPC Standards
  • ASTM B568 test method, for measurement of coating thickness by x-ray spectrometry
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