New X-Strata920:
XRF with Silicon Drift Detector Option
The X-Strata920 coating thickness measurement system is known as one of the most reliable systems offered by Hitachi High-Tech. Previously available under the Oxford Instruments name, the newest X-Strata920 has expanded the analyzers application reach by adding a Silicon Drift Detector (SDD) option.
The SDD configuration, which is competitively priced, allows a user to measure the broadest range of coating applications - from basic single layer applications to complex stacks (specifically, it meets IPC4552A standard for ENIG as well as ENEPIG and others).
The SDD configuration, which is competitively priced, allows a user to measure the broadest range of coating applications - from basic single layer applications to complex stacks (specifically, it meets IPC4552A standard for ENIG as well as ENEPIG and others).
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MAJOR ADVANCEMENTS AND FEATURES
Silicon Drift Detector (SDD): critical for many applications, the high resolution SDD Technology makes the X-Strata920 a powerful analyzer while remaining competitively priced
Chamber Configuration / Sizes: Multiple configurations are available depending on a users needs; slotted chambers, motorized stage, tall chambers, etc. Review the 3 XRF Chamber Configurations.
Small Collimators: Another option that is customized for the users needs is in the collimator package; the smallest is 0.025 x 0.05 mm
Flexibility in Calibration: The Hitachi X-Strata920 allows users to add as many calibrations as they need...without assistance from service (means no additional costs like other brands)!
Built for Printed Circuit Boards: Combine the SDD model for measurements of ENIG/ENEPIG, thin gold, etc with the motorized XY (movement of 7"x7") for easy quality control of circuit boards
LEARN MORE:
Silicon Drift Detector (SDD): critical for many applications, the high resolution SDD Technology makes the X-Strata920 a powerful analyzer while remaining competitively priced
Chamber Configuration / Sizes: Multiple configurations are available depending on a users needs; slotted chambers, motorized stage, tall chambers, etc. Review the 3 XRF Chamber Configurations.
Small Collimators: Another option that is customized for the users needs is in the collimator package; the smallest is 0.025 x 0.05 mm
Flexibility in Calibration: The Hitachi X-Strata920 allows users to add as many calibrations as they need...without assistance from service (means no additional costs like other brands)!
Built for Printed Circuit Boards: Combine the SDD model for measurements of ENIG/ENEPIG, thin gold, etc with the motorized XY (movement of 7"x7") for easy quality control of circuit boards
LEARN MORE:
- Measuring ENIG/ENEPIG coatings with xray fluorescence; for IPC Standards
- ASTM B568 test method, for measurement of coating thickness by x-ray spectrometry