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  • Analyzer Sales
    • Coating Thickness >
      • Hitachi FT110A
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    • Elemental Analyzers >
      • Hitachi EA6000VX
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      • Phthalates Tester
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    • Handheld XRF Analyzers >
      • Alloy Tester
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    • Used XRF Analyzers >
      • Available Used XRF
    • Other Technologies >
      • Handheld LIBS
      • Spectrophotometers: UV, NIR, FL
    • Mexico XRF Sales
  • Applications
    • Coating Thickness >
      • Common Coating Thickness
      • Ultra Thin Thickness
    • RoHS Testing
    • Alloy Analysis >
      • PMI: Alloy Testing
    • Analytical Labs
    • Electronics QC
    • App Downloads
  • Service & Standards
    • Standards Laboratory >
      • New XRF Standards
      • XRF Standards Certification
      • Private Label Services
    • Instrument Services >
      • XRF Certification
      • Evaluation / Repair
      • Handheld XRF Services
      • Handheld XRF Spares
      • Xray Radiation Safety Inspection
      • Protection Plans
    • Accreditations
  • Technology
    • Tech Blog
    • What is XRF?
    • XRF Benefits
    • XRF Resources
  • Contact / About
    • Contact
    • About
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Hitachi EA1400 Elemental Analyzer: 
​
the newest generation of multi-purpose XRF analyzers

Hitachi EA1400 Elemental Analyzer for multiple applications
Hitachi EA1400 Elemental Analyzer
The Hitachi EA1400 can be the solution for customers in a variety of application fields like process and quality control of cement or slags, failure analysis of abnormal spots, and inspection of foreign matter as well as RoHS testing.

​The multi-purpose EA1400 XRF analyzer can:
  • reduce measurement time
  • simplify data management
  • reduce operator errors
  • improve overall operational efficiency.
Request More Info
App Note: Detection Limits
The Hitachi EA1400 was developed with feedback from clients that used previous EA series systems (Hitachi/Seiko EA1000A series and EA1200VX)...simple operation and removing operator variabilities were as important as precision and speed.

With that in mind, the EA1400 combines high performance components with unique internal design approaches for longevity and stability while offering straight-forward software functions to provide a system that is easy to use and prevents variations that can be influenced by operators.
Advanced X-Ray Detection System Image
Key Advancements of the Hitachi EA1400:
  • Silicon Drift Detector (SDD) Technology
    • new components for industry leading performance
    • provides faster throughput 
    • effective for low Cd concentrations
    • lower measurement times
  • X-Ray Irradiation Method
    • component geometry improves results and repeatability
    • eliminates inconsistencies when samples aren't flat
  • Software Advancements; Precision Control
    • reduces operator error and influence
    • increased throughput
    • trend control
    • excellent data management and reporting options
Key Hitachi EA1400 Analyzer Specifications:
  • Element Range: Na(11) to U (92), with optional vacuum chamber
  • X-Ray Direction: x-ray vertical irradiation (coaxial sample observation)
  • X-Ray Source: small air-cooled x-ray tube with Rh target
  • Detector Technology: newly developed silicon drift detector (high resolution SDD)
  • Collimators / Spot Size: 1, 3, 5 mm (round)
  • Filter: five automatic switching
  • Sample Chamber Size: 304 x 204 x 110 (W-D-H, mm)
Contact to learn more

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