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  • Analyzer Sales
    • Coating Thickness >
      • Hitachi FT110A
      • Hitachi FT230
      • XStrata920
      • Hitachi FT160
      • Contact Gauges
    • Elemental Analyzers >
      • Hitachi EA6000VX
      • Hitachi EA1400
      • Hitachi EA1000AIII
      • Hitachi EA8000
      • Phthalates Tester
      • Bulk Analyzers
    • Handheld XRF Analyzers >
      • Hitachi XMet8000
      • Xmet Video Demos
      • Sample XRF Report
      • XRF Rental Info
    • Used XRF Analyzers >
      • Available Used XRF
    • Mexico XRF Sales
    • Spectrophotometers: UV, NIR, FL
  • Applications
    • Coating Thickness >
      • Common Coating Thickness
      • Ultra Thin Thickness
    • RoHS Testing
    • Alloy Analysis >
      • PMI: Alloy Testing
  • Service & Standards
    • Standards Laboratory >
      • New XRF Standards
      • XRF Standards Certification
      • Private Label Services
    • Instrument Services >
      • XRF Certification
      • Evaluation / Repair
      • Handheld XRF Services
      • Xray Radiation Safety Inspection
      • Protection Plans
    • Accreditations
  • Technology
    • Tech Blog
    • What is XRF?
    • XRF Benefits
    • XRF Resources
  • Contact / About
    • Contact
    • About
    • Join the Team
    • Testimonials
    • Sales Policy

Hitachi EA1400: 
​
the newest elemental analyzer for RoHS screening and more

The newest development in the Elemental Analyzer (EA) series by Hitachi High-Tech is the EA1400. It builds off the multi-application success of the EA1200VX and provides greater throughput potential than that model (and "competitive" systems) plus improved repeatability among other benefits.
New Hitachi EA1400 XRF for Elemental Analysis
Request More Info
App Note: Detection Limits
Key Applications:
  • RoHS Testing / Screening: fast throughput functions with high reliability
    • ​​most commonly used to test electronic components (both vendor and buyer side)
  • Process Control: materials such as slag and cement (and more)
  • Failure Analysis: investigation of contaminants
The Hitachi EA1400 was developed with feedback from clients that used previous EA series systems, the EA1400 combines high performance components, internal design approaches, and software functions to provide a system that is easy to use and prevents variations that can be influenced by operators.
Advanced X-Ray Detection System Image
Key Reasons:
  • Silicon Drift Detector (SDD) Technology
    • new and industry leading performance
    • provides faster throughput 
    • effective for low Cd concentrations
    • lower measurement times
  • X-Ray Irradiation Method
    • component geometry improves results and repeatability
  • Software Advancements; Precision Control
    • reduces operator error and influence
    • increased throughput
    • trend control
    • excellent data management and reporting options
Contact to learn more

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