High Precision XRF for Coating Thickness Measurements
Hitachi FT110A x-ray fluorescence analyzer
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The Hitachi FT110A x-ray fluorescence analyzer sets a new standard in industrial coating thickness quality control. Building on the success of the Seiko XRF line (SFT-3200, SFT-9200), the new Hitachi FT110A offers the highest performance, ease of use, and reliability. The versatile chamber design options are configured to efficiently meet thickness measurement needs from basic single layer measurements with high through-put needs to complex coating applications including alloy thickness and compositional analysis. |
Cost effective Hitachi FT110A XRF for coating thickness measurement needs.
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Watch XRF Demonstration Videos
MAJOR ADVANCEMENTS AND FEATURES
Set your sample, start measuring: The new Auto-focus function allows the FT110A to focus the observation optics system within seconds, speeding up throughput. View a video on Auto-Focus here.
Improved thin film measurements: An optimized component layout results in increased sensitivity for standard collimators (0.1mm, 0.2mm) an results in improved precision in thin film analysis. (Achieve the highest precision in ultra thin coatings with the FT160)
No Standards Needed: The new thin film FP software (max 5 layers) has been modified to allow thickness measurements without standards. Multi-layer and alloy plating measurements are also achievable.
Wide View Observation: This innovative observation system allows for an entire sample image (max 250 x 200mm) to be observed at one time. Additionally, a desired measurement area can be designated with ease using the narrow field image function. View a video on Wide-View Observation.
Set your sample, start measuring: The new Auto-focus function allows the FT110A to focus the observation optics system within seconds, speeding up throughput. View a video on Auto-Focus here.
Improved thin film measurements: An optimized component layout results in increased sensitivity for standard collimators (0.1mm, 0.2mm) an results in improved precision in thin film analysis. (Achieve the highest precision in ultra thin coatings with the FT160)
No Standards Needed: The new thin film FP software (max 5 layers) has been modified to allow thickness measurements without standards. Multi-layer and alloy plating measurements are also achievable.
Wide View Observation: This innovative observation system allows for an entire sample image (max 250 x 200mm) to be observed at one time. Additionally, a desired measurement area can be designated with ease using the narrow field image function. View a video on Wide-View Observation.
click image to view a presentation on the features of the FT110A XRF
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System and Chamber Overview:
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LEARN MORE:
- Overview of three major advancements found in the Hitachi FT-110A
- ASTM B568, test method for measurement of coating thickness by x-ray spectrometry
- Overview of three major advancements found in the Hitachi FT-110A
- ASTM B568, test method for measurement of coating thickness by x-ray spectrometry