Hitachi FT160:
​for ultra thin film coating measurements of micro-spot areas


​Equipped with polycapillary x-ray focusing optics and a high resolution silicon drift detector (SDD), the FT160 XRF Analyzer by Hitachi High-Tech provides high precision and throughput in small spot and ultra thin coating thickness measurements.
Top Four Features of the Hitachi FT160 Micro-XRF Analyzer

Polycapillary X-Ray Focusing Optics
see highly precise measurements on small spot targets
Silicon Drift Detector (SDD) Technology
high count rate and resolution with the latest XRF detector technology
Automatic Measurement Assistant Function
multi-point measurements are automatic and precise to improve your lab efficiency
Easy Operation Software
newly designed software makes daily operation simple for any operator level