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  • Analyzer Sales
    • Coating Thickness >
      • Hitachi FT110A
      • Hitachi FT230
      • XStrata920
      • Hitachi FT160
      • Contact Gauges
    • Elemental Analyzers >
      • Hitachi EA6000VX
      • Hitachi EA1400
      • Hitachi EA1000AIII
      • Hitachi EA8000
      • Phthalates Tester
      • Bulk Analyzers
    • Handheld XRF Analyzers >
      • Alloy Tester
      • Xmet Video Demos
      • Sample XRF Report
      • XRF Rental Info
    • Used XRF Analyzers >
      • Available Used XRF
    • Other Technologies >
      • Handheld LIBS
      • Spectrophotometers: UV, NIR, FL
    • Mexico XRF Sales
  • Applications
    • Coating Thickness >
      • Common Coating Thickness
      • Ultra Thin Thickness
    • RoHS Testing
    • Analytical Labs
    • Alloy Analysis >
      • PMI: Alloy Testing
    • App Downloads
  • Service & Standards
    • Standards Laboratory >
      • New XRF Standards
      • XRF Standards Certification
      • Private Label Services
    • Instrument Services >
      • XRF Certification
      • Evaluation / Repair
      • Handheld XRF Services
      • Handheld XRF Spares
      • Xray Radiation Safety Inspection
      • Protection Plans
    • Accreditations
  • Technology
    • Tech Blog
    • What is XRF?
    • XRF Benefits
    • XRF Resources
  • Contact / About
    • Contact
    • About
    • Join the Team
    • Testimonials
    • Sales Policy

Hitachi FT160 XRF Analyzer w/ Poly-Cap Technology:
​
for ultra thin film coating measurements of micro-spot areas


​Equipped with poly-capillary x-ray focusing optics and a high resolution silicon drift detector (SDD), the FT160 XRF Analyzer by Hitachi High-Tech provides high precision and throughput for small spot and ultra thin coating thickness measurement needs.

The stage movement of the FT160 is fast and precise, developed to hit the measurement spot quickly, measure, and move on to the next spot.

The FT160 XRF allows users to improve both throughput and precision.
Contact to learn more
Top Four Features of the Hitachi FT160 Micro-XRF Analyzer

Polycapillary X-Ray Focusing Optics
see highly precise measurements on small spot targets
Silicon Drift Detector (SDD) Technology
high count rate and resolution with the latest XRF detector technology
Automatic Measurement Assistant Function
multi-point measurements are automatic and precise to improve your lab efficiency
Easy Operation Software
newly designed software makes daily operation simple for any operator level
request a quote or demo
download a brochure
XRF analyzers for small to large circuit boards and wafers
Three chamber configurations to meet the needs of various users.
The most common configuration is the FT160 which has an optional wafer holder.
Other options are the FT160S for compact laboratory space and the FT160L for larger samples.

All three have options for a standard or high-sensitivity detector (SDD), choice of W or Mo tube,
and come with a 17um FWHM beam size, auto-focus features, and image processing.

Every Hitachi FT160 provides industry leading XY stage movement...
stage precision of <+/- 2um and stage speed of 80 mm/s
XRF interior chamber movement
Hitachi FT160 XRF, interior chamber and stage
request more information

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