You may work with samples for an application where an x-ray fluorescence (XRF) Analyzer with a sample spinner can provide a great advantage over systems without one. If your samples are not homogeneous without extensive sample preparation…examples being samples that are powders or granular, fabrics because they are porous, or geological samples…then a sample spinner can save preparation time (while minimizing sample amounts needed) along with providing greater accuracy with more consistency.
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While a lot of the XRF Sales conversations that we have are with facilities using X-Ray Fluorescence for coating thickness measurement or RoHS screening, we also have a lot of conversations about what is broadly referred to as elemental analysis and it covers testing needs in a number of industries. Often, when elemental analysis is the goal, we will discuss the “bulk analyzers” line from Hitachi High-Tech which includes the well-known X-Supeme8000 and the new LabX5000.
We wanted to focus some attention on the newer LabX5000 because the X-Supreme8000 has been around for years. The X-Supreme8000 remains popular because of its turret stage but the LabX5000 offers so many great features and is extremely affordable, so it does get a lot of attention too. The recent release of the newest x-ray fluorescence analyzer focusing on coating thickness measurements, the Hitachi FT230, is the result of years of work by the R&D team of Hitachi High-Tech. Work began by talking with users of XRF technology to see what operators like, and don’t like, in their current analyzers. However, this meant not just talking with users of current Hitachi systems (and older models from them, known as Seiko and Oxford Instruments) but also users of other brands (Fischerscope, Bowman XRF, etc).
Hitachi determined a lot from these discussions, but one overwhelming point stood out…XRF users want to limit the amount of time they spend setting up for a measurement run. It is estimated that 72% of XRF testing time is lost on set-up – the old adage that ‘time is money’ might pop into your mind right about now One of the more common discussions that the service team of Eastern Applied Research has with users of XRF analyzers is the difference between the terms ‘calibration’ and ‘certification’. These terms are often used in place of each other but have very different meanings that require different tasks be performed.
Does your XRF need to be calibrated or certified? One of the first questions associates of Eastern Applied Research ask when talking to customers looking to add x-ray fluorescence (XRF) for coating thickness measurements is about their sample size and throughput goals. Obviously, metal finishing touches on a lot of industries and various components in those industries. Depending on the use, an XRF could be measuring small fasteners with varying heights, thin but wide samples like unpopulated circuit boards, large samples like brake pads or many others in between.
It's important to discuss the product (samples) the XRF user will be testing because they need to know a sample will fit into the XRF chamber. The throughput question will factor into manual vs programmable operation and focusing options – but that can’t happen unless the size question is covered. |
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