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Xray Fluorescence Spectrometers for Material Analysis   XRF for Coating Thickness Measurements

Ultra Thin Film Measurement Equipment   Metal Analysis LIBS XRF OES
Process Control: spectrometers for process control of petrochemical, cement, RoHS screening, etc
Material Identification: the Hitachi 1200VX is highlighted for identification of a variety of materials
Ultra Thin Film: highly precise ultra thin measurements, popular in wafer fab quality control
Coating Thickness Measurements: improve quality control with precise thickness and composition


* How can Eastern Applied assist?
XRF for Ultra Thin Film Measurements
XRF for Coating Thickness
Process Control Equipment
Material Identification Systems
Used XRF Analyzers
Other Elemental Analyzer Interests (comment)
Eddy/Mag Contact Gauges
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