X-ray Fluorescence (XRF) Analyzers play a key role in quality control processes at many points in the electronics industry. The technology is used for fast testing of printed circuit boards, semiconductors, integrated circuits, and more.

Hitachi FT230 XRF Analyzer

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​Systems referenced in this overview
​include the following Hitachi XRF Analyzers:

• FT110A _ work-horse option for coating thickness measurement, with proportional counter detector
• FT230 _ cost effective Silicon Drift Detector (SDD) system for precise coating thickness with the option for RoHS screening
• FT160 _ premier system for micro-spot analysis with high precision stage movement
• EA1000AIII _ dedicated RoHS screening system with industry leading software
• LabX-5000 _ rugged with plating bath analysis capabilities

Some uses of x-ray fluorescence for quality control testing in the electronics industry include:

• COATING THICKNESS MEASUREMENT:

The right XRF analyzer will give users the ability to measure a wide range of coating applications. Two of the more critical applications are measuring ultra-thin gold plating and electroless nickel with phosphorous content (read about IPC-4552B and IPC-4556 here). XRF technology will measure multiple layers in a single scan.

• SOLDER COMPOSITION (AND THICKNESS):

Many different solder alloys are used in electronics manufacturing and XRF provides a non-destructive test method to quickly perform quality control checks on composition and thickness. Testing for lead content, both high and low as needed, is a common interest.

• ROHS TESTING:

Typically, measurement for heavy metals to meet RoHS regulations will require a dedicated analyzer. However, new systems like the Hitachi FT230, include the ability to screen for RoHS needs as well as measuring thickness and composition.

• PLATING BATH ANALYSIS:

Quick checks of plating baths make sure that processes are on point and that end products will be plated correctly. Dedicated systems like the LabX5000 are often used for just this use while some other models with SDD technology (Hitachi FT230) can provide bath analysis along with other testing options. We do suggest the Hitachi LabX5000 for testing at, or near, the bath line because of its rugged design.

While other analytical tools can be used for most of the above, XRF Analyzers offer a few key benefits. Two major benefits of XRF are that it’s a non-destructive test method and that it does not require extensive knowledge of it to operate one. However, modern XRF systems offer a few more benefits that may not be known…those include:
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• SMALL SPOT ANALYSIS: 
  ​This is more and more important as electronic components continue to get smaller and smaller (hence, micro-electronics). Some XRF analyzers will have smaller collimators than others but, for micro-spot analysis, users would look to an XRF with poly-capillary optics. These systems have small glass tubes that focus the x-ray source on extremely small spots while providing the ultimate accuracy of measurement. The Hitachi FT160 would be a top model to review if this is needed and offers a FWHM of 17um.

poly-cap for micro electronics

• HI-RESOLUTION DETECTOR SYSTEMS: 
  ​Silicon Drift Detectors (SDD) are the new norm for XRF analyzers in these applications. Proportional Counter detectors (see the Hitachi FT110A) still have a place because they last a long time and have a lower up-front cost, but SDD opens users up to thinner applications, better bath analysis, and quantification of phosphorus content in electroless nickel (ENi) applications (see the Hitachi FT230).
• FEATURES FOR FASTER THROUGHPUT: 
  Many recent advancements have come on the software side of XRF Analyzers. One interesting function found on the Hitachi EA1000AIII stops RoHS measurements as soon as statistical confirmation is achieved, so operators don’t have to wait for a full scan to declare pass/fail. From the coating thickness side, the Hitachi FT230 is full of time saving features and they can be reviewed here.

• MULTIPLE TESTING NEEDS SOLVED BY A SINGLE XRF ANALYZER: 
  Some analyzers can only meet one application category need or have restrictions on capabilities if they are able to do both. However, recent developments in XRF have resulted in systems that can perform both highly accurate coating applications (thickness measurements, composition) along with RoHS screening. Units like the Hitachi FT230 provide the ability to do everything with a single device and obtain high performance in each.

Electronic Quality Control with X-ray Fluorescence (XRF)

Organizations that are looking to add x-ray fluorescence for quality control testing in electronics have more options than ever before. It’s important to consider the precision needed in each application, the throughput goals, and data management needs. It’s also important to remember the long-term support that comes with a system…Eastern Applied Research sells both new and used analyzers for these needs, providing full support from installation/training to reference materials from our in-house XRF Standards laboratory.

​CONTACT Eastern Applied Research staff for a discussion on any of the above or your interests in x-ray fluorescence testing.