New XRF Equipment

Using a Solid State Si(Li) Detector (C to U) or Pin Diode Detector (S to U), the SEA line of XRF instruments can measure virtually any coating non-destructively. They use the best Fundamental Parameter Program available and can do most applications without any standards. Not only are they great production instruments but also very universal tools for your lab.

Applications include: Multilayer applications up to 5 layers, ultra thick gold (above 200 micro inches) in a multilayer, thin films as low as 20 angstroms, lead free solder and all constituents, Electroless Ni and Phos content, Gold Karat Analysis, Trace Metal Analysis, Plating Bath Analysis, Waste Water Analysis, Bulk Analysis (up to 30 elements from C to U), and many more.

Detailed SEA SERIES Information

Coating Thickness, Printed Circuit Boards, etc...
SFT (Spectrum Film Thickness) Series

In 1978 SII Nano Technology produced the world’s first fluorescent x-ray coating thickness gauge, the SFT 155. After more than thirty years, the SIINT (Seiko) brand of SFT series has become synonymous with reliability and accuracy as SIINT continues developing the SFT through world-wide customer interest, trust and support.

Continuing the legacy, the newest line in the SFT series are the 9000-models (9100, 9200, etc). This series is flexible in applications and use; from small parts to large boards, all with the accuracy and reliability that its users require.

The SFT-9000 models are simple to operate and are known for the software programs; which allow users to utilize Microsoft Word and Excel in record keeping and reporting. Some of the other standard features are: Laser Focus, Crash Protection, Constant Adjust, Fundamental Parameters, Precise Programmable Stage, Auto-Filters, Windows XP OS, Dell CPU, 32 bit microprocessor program and many other features.