X-Strata920 - XRF with Silicon Drift Detector Option

Hitachi XRF Analyzer with Silicon Drift DetectorThe X-Strata920 coating thickness measurement system is known as one of the most reliable systems offered by Oxford Instruments.  Now, Hitachi High-Tech (who acquired Oxford's XRF division) has expanded the analyzers application reach by adding a Silicon Drift Detector (SDD) option. 

The SDD configuration, which is competitively priced, allows a user to measure the broadest range of coating applications - from basic single layer applications to complex stacks (specifically, it meets IPC4552A standard for ENIG as well as ENEPIG and others).

Info follows; contact Eastern Applied to discuss your testing goals.

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MAJOR ADVANCEMENTS AND FEATURES

Silicon Drift Detector (SDD)critical for many applications, the high resolution SDD Technology makes the X-Strata920 a powerful analyzer while remaining competitively priced

Chamber Configuration / Sizes: Multiple configurations are available depending on a users needs; slotted chambers, motorized stage, tall chambers, etc.

Small Collimators: Another option that is customized for the users needs is in the collimator package; the smallest is 0.025 x 0.05 mm

Flexibility in Calibration: The Hitachi X-Strata920 allows users to add as many calibrations as they need...without assistance from service (means no additional costs)!

Built for Printed Circuit Boards: Combine the SDD model for ENIG/ENEPIG, thin gold, etc with the motorized XY (movement of 7"x7") for easy quality control of circuit boards

LEARN MORE:
          - 
Measuring ENIG/ENEPIG coatings with xray fluorescence; for IPC Standards
          - ASTM B568, test method for measurement of coating thickness by x-ray spectrometry

ANALYZER SPECIFICATIONS
(base model, options noted below)

Description: X-Strata920 XRF Analyzer
Element Range: Atomic Numbers 13(Al) to 92(U) - with SDD 
X-ray Source: Air Cooled X-ray Tube (50kV), tungsten target
Detector: Proportional Counter or Silicon Drift Detector (SDD)
Collimators: Round, 0.3mm (options include up to six)
Sample Observation: CCD Camera
Sample Image Focus: Laser Positioning
Configuration: Top-Down
Chamber Exterior: Size varies based on configuration
Sample Stage: Fixed or Motorized XY
Interface: Desktop computer and LCD monitor
Application Software: Thin Film FP, Thin Film Calibration
(all types of thin films, max 5 layers and 10 elements)
Data Process: Microsoft Excel and Word
   
  Options
Chamber: Slotted-Chamber Design
Slotted Chamber Stage: Fixed stage or Motorized XY
Collimators: Wide range of options available
Sample Image Focus: Auto-Focus (includes laser pointer)
Secondary Filter: Cobalt Filter
Software:

Calibration Options:
Fundamental Paremeters (FP), minimal standards
or empirical method; with traceable standards.