Raw Material Particle Contamination Analyzer

Particle Contamination Analyzer by HitachiThe Hitachi High-Technologies EA8000 x-ray particle contaminant analyzer enables rapid detection and elemental identification of metal particles approximately 20um in diameter found in the electrode plates of fuel cells and lithium ion rechargeable batteries.  

Metal particle contamination in electrode materials, separators of fuel cells, and lithium ion rechargeable batteries can cause heat and fire or decrease battery capacity and lifetime.  When the measurement parameters are set, the EA8000 automatically captures x-ray images, detects, and identifies metal particles enhancing the efficiency of failure analysis and testing.

APPLICATIONS:
Particle Contamination in Lithium Ion Battery Manufacturing

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MAJOR FEATURES:

Particle Contamination Example Image20um Particles Detected in Moments: Conventional X-ray CT systems require about 10 hours to detect metal particles 20um in diameter in battery electrode plates 250x200mm (about B4-size).  Hitachi High-Tech Science developed a new particle inspection technology, in combination with the x-ray transmission method, resulting in greatly reduced imaging time.  Detection time can be reduced to 3 to 10 minutes...more than 100 times faster than conventional times.

Automatic Particle Detection by Image Processing: The EA8000 conducts high-speed image processing and detects particle position automatically over the entire 250x200mm area using x-ray image capture.

Automatic Elemental Identification of the Detected Particle: fluorescent x-ray mapping at the particle location and automatic elemental identification can be performed.

Identification of Metal Particles in Battery Electrode Plates: Conventional instruments are only able to identify metal particles 20um in diamater when the particles are on the surface of the electrode plates.  Signals from embedded metal particles are very small due to the absorption by the surrounding sample material.  The EA8000 uses unique focused x-ray optics to identify the elements in metal particles depper within electrode plates and organic films.

Transmission X-ray and EDXRFHigher Efficiency with All-In-One Instrument: Detection speed and metal contaminant identification can be done in a much shorter time than with conventional instruments.  An x-ray imaging unit, fluorescent x-ray analyzer, and optical microscope are integrated into one system to provide automatic results.  An operator can simply place a sample and make measurements, resulting in efficient work and high throughput.

ANALYZER SPECIFICATIONS:

Description Hitachi EA8000
Particle Size: Down to 20um
Detection Size: Approximately 3 to 10 minutes (imaging 250x200mm)
Elemental Analysis Time: Approximately 1 to 4 minutes per detection (varies)
Elements: Atomic No's: 12 (Mg) to 92 (U)
Sample State: Solid / Powders
Sample Size: 250mm x 200mm (W-D)
X-Ray Tube (XRF): Air-Cooled, 45kV, 900uA
X-Ray Angle (XRF): Bottom-Up Irradiation
Beam Size (XRF): 30um
ED-XRF Detector: Vortez SDD (Si Drift Detector), No LN2
X-Ray Tube (transmission): Water cooled X-ray tube
Sample Observation: High resolution CCD (air cooled)
Controller: High resolution lens and CCD camera
Automatic Particle Analysis: Desktop and 19" TFT monitor
Particle Size Measurement: Performed automatically
Data Process: Detected particle size measured automatically
Data Processing: Excel and Word
Safety Mechanism: Door interlock, crash protection, self-diagnosis
Power Requirements: AC200V to 240V +/-10% Single Phase, 20A