Major Damage to Your Xray Fluorescence Analyzer?

An earlier XRF-Blog entry highlighted what users of x-ray fluorescence can do to extend the life of their analyzer. 
This entry focuses on the times that are out of the users control – when major damage occurs to a system.

A few examples of recent major damage issues that we’ve seen…

Hydrochloric Acid Spill – acid was sucked into the XRF analyzers fans, creating corrosion to the internal components and destroying the computer.  Our technical staff was able to clean the system, replacing the corroded boards and components in addition to the computer system (with updated software).

Multiple Units Repaired After Fire Damage – it was like “XRF Backdraft”…smoke, fire and water get on the systems (during the fire and the effort to put it out) and the systems required a thorough cleaning of the ash, completely revamping the interior of the machine and component replacement; but the customers still saved money when compared to investing in multiple new units.

Water Line Over the Analyzer Broke – water everywhere…essentially destroyed the electronics and power supplies.  After an extended dry time then a thorough cleaning and reparing of components/wiring, the analyzer worked well and saved the budget of our customer.

Repaired-XRF-Analyzer

As you can see, in the twenty years that Eastern Applied Research has been providing support of XRF analyzers, our technical staff has seen some very tough spots for our clients and their xray units.  While we can offer the option of new analyzers, not all clients have the budget to consider that – especially after some of the issues that affect much more of a business than just the xray fluorescence unit.

Eastern Applied Research works for the clients and offers all the options possible to solve their problems.  Our in-house staff has worked some ‘miracles’ to limit the out-of-pocket while providing end-users with good working systems.

Hopefully, you don’t run into problems like the above…but, if you do, Eastern Applied will do our best to offer multiple options.  Of course, our technicians can do the minor repairs and adjustments you may require as well so keep us in mind for all questions relating to x-ray fluorescence.  Learn more about our repair and evaluation services or contact us to discuss your interests.

Maximizing Profits with Plating Measurement Systems

Clients of Eastern Applied Research use x-ray fluorescence analyzers to measure a variety of coatings.  The plating of interest can be any number of metals – one of the more common, and most costly, is gold.  As the cost of gold continues to climb, companies that perform gold plating services see increased importance on having a quality X-ray Fluorescence based measurement system – one that includes the XRF analyzer, traceable standards and the support needed to understand the technology…allowing for maximum performance and increasing profits.

Sample_PCB_XRF_AnalyzerWith a reliable XRF based measurement process, companies that provide gold plating services can plate closer to their minimum specification.  If a measurement system can confirm your plating process is controlled properly, then you can save gold (or other metals) – maximizing your profits with the help of XRF technology.  You can lower your target thickness and ensure you are comfortably within your required specification when the XRF analyzer is properly calibrated with the best measurement techniques and standards of low uncertainty.

Without a reliable measurement process, utilizing x-ray fluorescence technology, a plating company will not be able to control excess plating.  You need to define the uncertainty of your measurement process.  Only after it is confirmed that the measurement system is working properly can your plating process be adjusted to near the minimum thickness reliably and consistently.

Reworks from under-plating are expensive, so most plating companies will plate heavy to ensure they meet the minimum.  However, in the long run, this over-plating approach is as expensive as reworks.  As an example, if you are plating 15u” of gold to make sure you meet the clients minimum requirements of 10u”, then you are wasting as much as 50% of your gold.  XRF technology can control your measurement process to target 11u” of gold reaching near a six-sigma confidence level – then you can save 27% on your gold costs.  Again, with increasing gold costs, this savings equation can be substantial (and isn’t just limited to gold, of course).

The first step in maximizing profits is having confidence that you are measuring accurately and with repeatability; then you can adjust the plating line to control your process.  At Eastern Applied Research, we can provide the system, methodology and training to define the measurement uncertainty.  Once we show you that your uncertainty is 2% (this varies per application and system used) you only need to plate 2% higher than the minimum.  Any additional amount of thickness you add is based on your ability to control the plating process itself – but to control that you need the best measurement system and a complete understanding of the measurement uncertainty inherent in any system.

If you are over-plating to avoid out of specification product then you are throwing money away and allowing competitors that use XRF measurement systems to have an advantage that allows them to quote lower than you.  Eastern Applied Research Inc specializes in coating measurement systems, and has for twenty years.  We can help you improve your process and maximize profits – schedule a conversation with an Application Specialist to discuss your process and XRF Technology.

Knowing State Regulations Relating to XRF Analyzers

Recently, an organization in Oregon purchased an Element Xr analyzer for their coating thickness measurement requirements.  When discussing the details of the purchase, the Eastern Applied representative working with the client was asked about our x-ray vendor license for the state.  Several years ago we did submit an application and were approved for work relating to industrial x-ray machines within that state.  The permitted work includes calibration/repair of analyzers and accepts us as a distributor of x-ray units in the state.

Many states require that an accredited service company is performing the work (Eastern Applied is Accredited to ISO/IEC) and sometimes, as was the case with Oregon, that the service company is registered with the state.  Since Eastern Applied specializes in sales and service of x-ray fluorescence we are licensed with the majority of states to provide instruments and services.

XRF-State-RegulationsIn addition to the vendor or service provider being licensed with a state, the users of X-ray Fluorescence (XRF) should be aware of the individual state laws relating to the systems and what licensing may be required of them as owners.  Many users simply consider the Federal laws that may have to be followed but individual state laws are often more critical in terms of registering a system for use within a state.  Most states require licensing (with a small fee) along with requirements that instrument calibration and safety radiation surveys be performed at designated intervals – with proof of services being appropriately submitted.

Eastern Applied can provide contact information for each state – so contact one of our technical advisors if you are adding a system, have had an XRF Analyzer for a while but don’t know if you are licensed or if you want to make sure you are working with a service provider that is licensed for your state.

Xenemetrix EDXRF Detection Systems: Silicon Drift (SDD) v PIN-Diode (Si-PIN)

The Xenemetrix line of EDXRF Spectrometers will typically come standard with a Silicon Drift Detection (SDD) system but they do have the option of being built with a Si-PIN Diode System (Si-PIN).  Both styles of detector assemblies offer benefits to the end users and this blog entry provides a summary of a performance comparison of the two – you can request the full comparison note here.

OBJECTIVE
To perform a quantitative comarison between the performance of the X-Calibur EDXRF Analyzer with a SDD detector installed or a Si-PIN detector.  The sensitivity and performance of X-Calibur at different energies when equipped with different detectors is expressed in the minimum detection limits (MDL) of the different elements.

SDD versus Si-PIN Diode
Xenemetrix desktop x-ray fluorescence analyzers had traditionally been equipped with Si-PIN detectors that provided outstanding resolution and count rate capacity at the time.  However, Silicon Drift Detectors were introduced and today it has become the ‘detector of choice’ for many material analysis applications.

Si-PIN technology offers an economical detection system which, in turn, allows for a lower priced analyzer.  They also offer a larger active area and thickner depletion depth.  When resolution is critical but high detection efficiency is not important, the Si-PIN system will be suggested.  However, SDD technology offers a much better energy resolution at short peak times; which is helpful at high count rates and can lead to lower limits of detection.

ANALYTICAL CONFIGURATION

Xenemetrix X-calibur EDXRF SpectrometerInstrument: X-Calibur EDXRF Spectrometer
Anode: Rh-Anode X-ray Tube, 50W
Detector: VARIABLE of SDD or Si-PIN
Analysis Time: 300 seconds per measurement
Goal of Analysis: Determine minimum detection limits (MDL)
Sample Overview: Liquid Samples, no preparation

SAMPLES
A variety of sample solutions were used to determine the MDL; including water, diesel and oil solutions.  The full list can be found in the complete comparison sheet but some include:
-  Certipur Zinc Standard Solution; 1000mg/l, MERK
-  5.6% Na in water (in-house standard)
-  VHG Labs Sulfur in #2 diesel, 1000ppm

Measurement times were set for 300 seconds.  Typical conditions were air but light element information was aquired using a helium purge.  Tube filters varied according to the sample and element of interest.

MINIMUM DETECTION LIMITS
A detailed overview of the MDL determination can be reviewed in the full comparison sheet but a few example results including:
          Element     MDL SDD ppm     MDL Si-PIN ppm
               Na               700                        1,600
               S                 1.3                           3.2
               Zn               0.3                           1.0

Graph of MDL measured with SDD and Si-PIN detectors (S to Ba only)
Detection Limits of XRF Detectors

DISCUSSION
The comparison shows that the main advantage that SDD provides is the ability to acquire spectra at very high count rates without compromising on the resolution.  In this review, it is obvious that the high count rate is key to the low minimum detection limits obtained with the Silicon Drift Detector (SDD).  That being said, the Si-PIN compares favorably with elements that have higher energy and it allows for a lower analyzer cost.

Request the complete comparison (including results, spectrums, etc)
~ or ~
Contact Eastern Applied Research to discuss the available detection systems and elemental analyzers

Event Recap: Surface Finishing Conference (Sur/Fin) 2011

There is something about face to face conversations.

The National Association of Surface Finishing (NASF) recently held its yearly Sur/Fin conference in Rosemont, IL.  Eastern Applied Research was pleased to be an exhibitor as we had many interesting conversations (face to face ones) throughout the event.

With a large number of our clients being involved in metal finishing, and based in the MidWest, this was an excellent event for catching up with current clients that attended Sur/Fin.  This face-to-face time was beneficial in keeping up to date with current service customers and showing them, many of whom utilize older XRF technologies, the newest x-ray fluorescence for coating thickness measurements – the Element Xr line.

New Coating Thickness Measurement EquipmentObviously, the opportunity to speak to potential future clients about all the service, support and solutions that Eastern Applied can offer the metal finishing industry was a great benefit.  Booth personal were able to learn about the concerns of metal finishers and discuss the potential solutions that we can offer.

Demonstrations of the Element Xr line were performed on a prototype of system that will provide another top solution in coating thickness analysis.  In addition, the Eastern Applied associates at the booth were able to discuss our “conti-systems” which allow for faster through-put right on the production floor.

All in all, an excellent exhibition…we look forward to speaking with any attendees again in the near future.