Archive for August, 2012

Details of Two Coating Thickness Measurement Systems

From basic single layer applications to multi-layer and ultra thin-film measurement needs, specific interests relating to coating thickness measurement vary greatly.  In order to provide the most efficient solution for specific measurement needs, Eastern Applied Research offers XRF analyzers that vary in design and configuration.

Various options are available through Eastern Applied Research, including used XRF options and the newest generation of systems from Hitachi High-Technology (formerly knows as Seiko XRF).  A few options should be discussed with Eastern Applied associates and your internal team to know what the best fit is for your needs.

Comparing two Used XRF Analyzers that are frequently available through Eastern Applied, the CE-P and M5 from the Element Xr line, we cover a few of the discussion points:

Internal Chamber Size
Circuit Board Sample MeasurementAn area that is critical to many organizations is having adequate space in the chamber for their samples.  When comparing chamber sizes, the internal chamber of the CE-P offers an area of 4.4″x13.3″x14.5″ (H, W, D), allowing for a good range of sample sizes while retaining a compact overall footprint.  In contrast, the M5’s internal chamber lists at a larger 13.8″x23.6″x19.7″ (H,W, D) and accommodates a much wider variety of sample sizes.

Stage Movement
While both analyzers have sample stages that can move in the Z direction (up/down), the CE-P is limited to only that…and with a range of 2.36″.  The M5, however, includes a measurement head that offers full X-Y-Z movement with up to 7″ of Z movement.  In addition, the M5 offers an optional motorized stage that allows the user to measure specific parts on a sample without having to manually position them each time.

General Design
While both models have chambers that are loaded from the front, only the M5 has a slotted chamber.  This feature allows for samples wide than the chamber (wires, rods) to have their plating thickness measured.

Element Xr M5 in Standards Laboratory
Larger PCB Applications

The CE-P and M5 perform on par for numerous applications related to coating thickness; however, the M5 has the advantage when testing larger printed circuit boards.  The M5 can accommodate and analyze variable sizes of PCB’s much easier than the CE-P because of its slotted chamber and optional motorized X-Y-Z sample stage.

The greatest advantage of both Element Xr systems is that they can be customized at any time.  One major area of customization for each is that they can be configured with either a proportional counter or PIN-Diode detection system.  Two customizable features exclusive to the M5 are the previously mentioned motorized samples stage and an optional upgrade to a multi-collimator changer.

While differences are present, what both Element Xr analyzers offer are reliable and repeatable measurement results with optional customization for the most efficient solution to your coating thickness measurement needs.  Furthermore, each instrument offers streamlined software that functions seamlessly with a Windows 7 operating system so that reports are simple to develop and share.

What is important to your testing needs?  What chamber design features are most critical? 
Let us know with a comment or contact our associates to discuss the best fit.

Element Xr for Coating Thickness