Archive for January, 2012

Improve Laboratory Efficiency with an XRF Turret Stage

Eastern Applied Research offers several x-ray fluorescence spectrometers that provide material analysis of powders, liquids and solids; featuring the Hitachi 1200VX.  These analyzers will often be utilized in an industrial or University laboratories.  In this type of setting, the ED-XRF technology is often utilized as a screening device and the throughput potential is a major benefit for the laboratories that add ED-XRF.  Among other aspects of the technology, increased throughput from ED-XRF is made possible by the inclusion of a turret stage.

Xenemetrix XRF Turret StageWhen organizations take advantage of turret stages they will realize increased efficiencies from the XRF analzyer and the laboratory personnel utilizing it.  Also known as ‘automatic sample changers’, they provide operators with two different approaches to increase measurement efficiency – both are detailed below.

STANDARD BENEFIT: Take Multiple Readings on Multiple Samples
When sample conditions will be the same for all of the samples in a batch, the turret stage provides the operator with time to handle other tasks while measurements are performed.  Simply set the appropriate test parameters and fill the stage with prepared sample materials and begin the measurement.

As an example of the time savings, with a 100 second measurement for each sample in a ten-sample changer, an operator will free up over 16 minutes of time!  This benefit is exponential when taking multiple readings on each sample…take five measurements of each sample at 100 seconds and the operator frees up over one hour of time.

ENHANCED BENEFIT: Set Multiple Conditions
To expand on the benefit noted above, many XRF Spectrometers allow users to set multiple measurement conditions and then save them for a quick recall.  This is beneficial because using optimum conditions (ie appropriate filters) for specific elements of interest will enhance the accuracy of the instrument when looking for those target elements.

An operator can prepare five different measurement conditions to focus on five different elements of interest that will be the same for each sample on a ten position sample stage.  The analyzer can automatically run through the five measurements on the first sample and then automatically move onto the next sample, running through all five conditions before moving onto the next sample.  If a laboratory technician set five conditions and took five measurements of 100-seconds each on ten samples, they would free up over six hours of their time.

Do you feel that this option may help to increase your lab’s throughput?  If so, request a free consultation from an XRF Sales Associate from Eastern Applied to discuss the potential efficiency that it can offer.  The Hitachi High-Technologies line of x-ray fluorescence includes several elemental analyzers with turret stage options.

Turret Stage Design

Design of an XRF with Turret Stage