XRF Coating Thickness Equipment: Element Xr

X-Ray Fluorescence SpectrometersThe new Element Xr analyzer line has been developed with the experience and knowledge that Eastern Applied Research associates have gained while providing more than twenty years of x-ray fluorescence sales and support.  A primary focus while developing the initial instruments has been to solve a variety of coating thickness measurement needs - from basic single layer coatings to thin film measurements and complex coating systems, Element Xr provides a variety of options to meet an organizations quality control requirements.

Element Xr CE-P Analyzer: 
a compact design featuring a proportional counter detector; the standard for most coating measurement needs

Element Xr M6 System:
choose from multiple detectors to meet your thickness measurement needs, from basic to complex

Related Reading:
          - An example of how X-ray Fluorescence can help maximize profits
          - Factors that are considered when choosing an XRF analyzer for coating thickness
          - Comparing features of two Element Xr analyzers

Coating Thickness Measurement XRF Analyzers