XRF Coating Thickness Equipment: Element Xr

The new Element Xr analyzer line has been developed with the experience and knowledge that Eastern Applied Research associates have gained while providing more than twenty years of x-ray fluorescence sales and support. A primary focus while developing the initial instruments has been to solve a variety of coating thickness measurement needs - from basic single layer coatings to thin film measurements and complex coating systems, Element Xr provides a variety of options to meet an organizations quality control requirements.

CE-P Analyzer:
a compact design featuring a proportional counter detector; the standard for most coating measurement needs

Customizable XRF Analyzer:
a variety of options let an end-user develop a system to their needs and budget; eliminating uncessary features