XRF Coating Thickness Equipment: Large Chamber Designs

Newest XRF Analyzers by Oxford Instruments
The newest XRF analyzer options from Oxford Instruments, the Compact and Maxxi systems, each feature a large interior chamber and options that allow end-users to develop a cost efficient unit to meet their specific application interests. 

A primary focus while developing the instruments has been to solve a variety of coating thickness measurement needs - from basic single layer coatings to thin film measurements and complex coating systems, both the Compact and Maxxi provide a variety of options to meet an organizations quality control requirements.

COMPACT ANALYZER (click for details)
a compact design featuring a proportional counter detector; the standard for most coating measurement needs for efficient through-put

MAXXI SYSTEM (click for details):
choose from multiple detectors to meet your thickness measurement needs and the optional motorized/programmable XY stage movement for optimum performance

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